Semiconductor Device and Method for Manufacturing a Semiconductor Device

ABSTRACT

A semiconductor device includes a semiconductor substrate including a main surface with a polygonal geometry and a main electric circuit manufactured within a main region on the semiconductor substrate. The main electric circuit is operable to perform an electric main function. The main region extends over the main surface of the semiconductor substrate leaving open at least one corner area at a corner of the polygonal geometry of the main surface of the semiconductor substrate. The corner area extends at least 300 μm along the edges of the semiconductor substrate beginning at the corner.

FIELD

Embodiments relate to semiconductor-based electric circuits and inparticular to a semiconductor device and a method for manufacturing asemiconductor device.

BACKGROUND

A semiconductor device is often exposed to high temperatures and varyingpressures during the manufacturing process. Also during the separationof chips on a thin wafer by sawing methods there exists the risk ofgenerating slight pre-damages at the silicon side wall of chipsunintentionally. At such positions, a development or a propagation oflong-reaching cracks within the silicon may occur during the furtherprocessing of packaging the chips due to additional temperature load andstress load. Such cracks may lead to malfunctions or breakdowns. It isdesired to avoid such electrical breakdowns.

SUMMARY

A semiconductor device according to an embodiment comprises asemiconductor substrate comprising a main surface with a polygonalgeometry and a main electric circuit manufactured within a main regionon the semiconductor substrate. The main electric circuit is operable toperform an electric main function. The main region extends over the mainsurface of the semiconductor substrate leaving open at least one cornerarea at a corner of the polygonal geometry of the main surface of thesemiconductor substrate. The corner area extends at least 300 μm alongthe edges of the semiconductor substrate beginning at the corner.

Embodiments may be based on the finding that cracks within thesemiconductor substrate caused by different kinds of loads during themanufacturing process may reach a main surface of the semiconductoroften in the proximity of the corners of the semiconductor device.Malfunctions and/or breakdowns of semiconductor devices can be avoidedby leaving open the corner area from elements of the main electriccircuit so that the main electric function of the semiconductor deviceis significantly less endangered by these cracks. In this way, thereliability and/or the production yield can be also improved.

In some embodiments, the semiconductor device may comprise an electrictest circuit manufactured within the at least one corner area on thesemiconductor substrate. This electric test circuit is operable toenable an electric test function. In this way, the space of the cornerarea can be used for structures for test measurements (e.g. ON-stateresistance). However, cracks within the corner area may not lead tomalfunctions or breakdown of the main electric circuit so that thesemiconductor device may be still usable. Further, the corner area maynot be wasted space in this case.

In some embodiments, all electrically conductive structures manufacturedwithin the corner area on the semiconductor substrate are electricallyconnected to the semiconductor substrate or electrically isolated sothat in an operating state of the semiconductor device each of theelectrically conductive structures either comprises basically the sameelectric potential as the semiconductor substrate or is electricallyfloating. In this way, shorts caused by cracks may be avoided.

Some embodiments relate to a power semiconductor device comprising asemiconductor device according to the described concept with at leastone active element of the main electric circuit comprising a breakdownvoltage higher than 10 V.

BRIEF DESCRIPTION OF THE DRAWINGS

Some embodiments of apparatuses and/or methods will be described in thefollowing by way of example only, and with reference to the accompanyingfigures, in which

FIG. 1 shows a schematic bird's eye view of a semiconductor device;

FIG. 2 shows a schematic illustration of a corner area of asemiconductor device;

FIG. 3 shows a schematic bird's eye view of a semiconductor device;

FIG. 4 shows a schematic bird's eye view of another semiconductordevice;

FIG. 5 shows a schematic illustration of a corner area;

FIG. 6 shows a schematic illustration of trenches within a main regionand within a corner area on the semiconductor substrate of asemiconductor device;

FIG. 7 shows a schematic cross section of a transistor of asemiconductor device; and

FIG. 8 shows a flowchart of a method for manufacturing a semiconductordevice.

DETAILED DESCRIPTION

Various example embodiments will now be described more fully withreference to the accompanying drawings in which some example embodimentsare illustrated. In the figures, the thicknesses of lines, layers and/orregions may be exaggerated for clarity.

Accordingly, while example embodiments are capable of variousmodifications and alternative forms, embodiments thereof are shown byway of example in the figures and will herein be described in detail. Itshould be understood, however, that there is no intent to limit exampleembodiments to the particular forms disclosed, but on the contrary,example embodiments are to cover all modifications, equivalents, andalternatives falling within the scope of the invention. Like numbersrefer to like or similar elements throughout the description of thefigures.

It will be understood that when an element is referred to as being“connected” or “coupled” to another element, it can be directlyconnected or coupled to the other element or intervening elements may bepresent. In contrast, when an element is referred to as being “directlyconnected” or “directly coupled” to another element, there are nointervening elements present. Other words used to describe therelationship between elements should be interpreted in a like fashion(e.g., “between” versus “directly between,” “adjacent” versus “directlyadjacent,” etc.).

The terminology used herein is for the purpose of describing particularembodiments only and is not intended to be limiting of exampleembodiments. As used herein, the singular forms “a,” “an” and “the” areintended to include the plural forms as well, unless the context clearlyindicates otherwise. It will be further understood that the terms“comprises,” “comprising,” “includes” and/or “including,” when usedherein, specify the presence of stated features, integers, steps,operations, elements and/or components, but do not preclude the presenceor addition of one or more other features, integers, steps, operations,elements, components and/or groups thereof.

Unless otherwise defined, all terms (including technical and scientificterms) used herein have the same meaning as commonly understood by oneof ordinary skill in the art to which example embodiments belong. Itwill be further understood that terms, e.g., those defined in commonlyused dictionaries, should be interpreted as having a meaning that isconsistent with their meaning in the context of the relevant art andwill not be interpreted in an idealized or overly formal sense unlessexpressly so defined herein.

FIG. 1 shows a schematic illustration of a semiconductor device 100according to an embodiment. The semiconductor device 100 comprises asemiconductor substrate. This semiconductor substrate comprises a mainsurface with a polygonal geometry. Further, the semiconductor device 100comprises a main electric circuit manufactured within a main region 110on the semiconductor substrate. The main electric circuit is operable toperform an electric main function of the semiconductor device 100. Themain region 110 extends over the main surface of the semiconductorsubstrate leaving open at least one corner area 120 at the corner 122 ofthe polygonal geometry of the main surface of the semiconductorsubstrate. The corner area 120 extends at least 300 μm along the edges124 of the semiconductor substrate beginning at the corner 122.

During the manufacturing process of the semiconductor device 100 (e.g.wafer sawing and packaging afterwards) various kinds of stress areapplied to the semiconductor device 100. The stress may result in cracksin the semiconductor substrate. For example, these cracks may arisetypically in the proximity of the back side and often stay there (e.g.depending on the type of package and/or the type of semiconductordevice). Due to different kinds of stress conditions, particularly closeto the chip corner (corner 122 of the semiconductor substrate), thesecracks may be deflected to the surface (the main surface of thesemiconductor substrate) within the chip corner area (corner area 120 ofthe semiconductor substrate). Most of these cracks occur at the mainsurface of the semiconductor substrate within a range of 300 μm from thecorner of the semiconductor substrate. By leaving open the corner area120, malfunctions and/or breakdowns within the active chip region (mainregion 110 of the semiconductor substrate) caused by such cracks can beavoided. Further, the yield and/or the availability of the semiconductordevice 100 may be improved.

The semiconductor substrate may be the bulk material on which electriccircuits (e.g. the main electric circuit) are manufactured. For example,the semiconductor substrate may comprise any semiconductor material(e.g. silicon or gallium arsenide), depending on the kind ofsemiconductor device. The semiconductor substrate may have been part ofa wafer during the front end manufacturing of the semiconductor device100 and may have been separated from other semiconductor devicesafterwards. The semiconductor substrate may comprise a basic doping(e.g. n or p doping).

The main surface of the semiconductor substrate may be the surface themain electric circuit is manufactured on. This main surface comprises apolygonal geometry (e.g. a rectangle, a square or a triangle).

The main electric circuit enables the electric main function of thesemiconductor device 100. Depending on the kind of semiconductor device,the main electric circuit may comprise an arbitrary number and/orarbitrary types of electrically active and/or passive elements. Forexample, the main electric circuit may comprise a single transistor(e.g. power semiconductor device) or may be a highly-complex circuitrywith analog (e.g. charge pumps, phase locked loops and/or amplifiers)and/or digital (e.g. arithmetic logic units) parts as well as differentfunctional blocks as memory blocks, analog-digital converters and/orinput-output interfaces or any other circuit, for example. However,electric test circuits (e.g. for ON-state resistant measurements) forproduction tests or monitoring may not be part of the main electriccircuit, since these electric test circuits may not contribute to theexecution of the electric main function of the semiconductor device 100.

The main electric circuit is manufactured on the semiconductorsubstrate. This may mean that elements of the main electric circuit aremanufactured on top of the main surface of the semiconductor substrate(e.g. transistor gates, contacts or metal layers). However, it may alsoinclude elements manufactured into the semiconductor substrate startingfrom the surface (e.g. trenches, gate oxide, implanted wells or otherimplant regions different from the basic implant of the semiconductorsubstrate). In other words, the main electric circuit is manufactured onthe semiconductor substrate and may comprise structures ranging from theimplant regions (e.g. active areas, gates, contacts) to the metal layersabove the semiconductor substrate.

The main electric circuit is manufactured within the main region 110. Inother words, the main region 110 contains the elements of the mainelectric circuit manufactured on the semiconductor substrate. However,the semiconductor substrate itself may also be used as an electrode(e.g. bulk electrode or back side drain electrode) and may be in theseterms part of the main electric circuit. Nevertheless, the semiconductorsubstrate is obviously manufactured on the semiconductor substrate sothat the semiconductor substrate may be a part of the main electriccircuit although it may also extend through the corner areas 120.

The main region 110 leaves open at least one corner area 120. In otherwords, the main region 110 may extend over the whole main surface of thesemiconductor substrate with the exception of the at least one cornerarea 120 as well as optionally each further corner area, for example.

The corner area 120 contains a corner 122 of the polygonal geometry andextends at least 300 μm along the edges 124 of the semiconductorsubstrate beginning at the corner 122. In other words, the corner area120 is bordered at two sides by the edges 124 of the semiconductorsubstrate beginning at the corner 122 of the corner area 120. In thisway, a corner 122 of the polygonal geometry can be defined as the originof the corner area 120 and the two edges 124 of the semiconductorsubstrate meeting each other at the corner 122 form borders of thecorner area 120 at two sides of the corner area 120. These sides of thecorner area 120 extend at least 300 μm along the edges 124 starting atthe corner 122.

FIG. 2 shows a detailed view of a corner area 120. The back side of thesemiconductor substrate 200 in the proximity of the corners 122 of thesemiconductor substrate 200 may be a region of enhanced stress 210during manufacturing. In these regions of enhanced stress 210, thegeneration of cracks 220 may be more likely than in other regions of thesemiconductor substrate. These cracks 220 may tend to propagate to themain surface of the semiconductor substrate 200 under temperature loadand/or stress load (e.g. after wafer sawing during packaging). Most ofthese cracks 220 reach the main surface of the semiconductor substrate200 within a distance of less than 300 μm away from a corner 122 of thesemiconductor substrate 200. Therefore, manufacturing the main electriccircuit of the semiconductor device 100 away from the corner 122 mayresult in a reduced number of malfunctions and/or breakdowns and in animproved yield and/or reliability of the semiconductor device 100.

It may be sufficient to leave open only one corner area 120 at onecorner 122 of the polygonal geometry although the polygonal geometry ofthe main surface of the semiconductor substrate comprises more than onecorner, since some parts of the main electric circuit may be moresensitive to cracks than others so that on the one hand the mostsensitive parts may be protected by leaving open corner areasneighboring such parts and on the other hand not too much area of thesemiconductor substrate is wasted. However, optionally, a corner regionmay be left open at each corner of the polygonal geometry. In otherwords, the main region 110 may extend over the main surface of thesemiconductor substrate leaving open a corner area 120 at every corner122 of the polygonal geometry of the main surface of the semiconductorsubstrate. Each corner area 120 may extend at least 300 μm along theedges of the semiconductor substrate beginning at their respectivecorners, as it is shown in FIG. 4, for example.

Alternatively, also more than one corner area 120 at more than onecorner 122 but not at every corner of the polygonal geometry may be leftopen as it is shown in FIG. 3, for example.

The semiconductor substrate and the main region 110 may be of any size.However, since the corner area 120 may occupy a significant portion ofthe main surface of the semiconductor substrate, the main region 110 maybe larger than 5 mm² (or larger than 12 mm², 20 mm² or 25 mm²).

In the following, optional aspects may be described for one corner area120. However, this aspects may be realized for more than one or allcorners of the polygonal geometry.

Optionally, in order to further reduce the risk of malfunctions and/orbreakdowns of the semiconductor device 100, the corner area 120 may beextended. For example, the corner area 120 may extend at least 500 μmalong the edges of the semiconductor substrate beginning at the corner122. Since no (or not yet) cracks have been detected caused by thedescribed mechanism reaching the main surface of the semiconductorsubstrate, more than 500 μm away from a corner 122 of the semiconductorsubstrate, the risk of malfunctions and/or breakdowns of semiconductordevices due to this failure type may be significantly reduced. Forsafety reasons, the corner area 120 may be further enlarged. Forexample, the corner area 120 may extend at least 750 μm along the edgesof the semiconductor substrate beginning at the corner 122. However,this also significantly reduces the area available for the main electriccircuit. So it may depend on the application whether safety reasons aremore important than area consumption reasons.

Since the expansion of the corner area 120 along the edges 124 of thesemiconductor substrate may not directly influence the total areacovered by the corner area 120, since the edges 124 limit the cornerarea 120 only at two sides. Therefore, a minimum area for the cornerarea 120 may optionally be defined. For example, the corner area 120 mayextend at least 300 μm along the edges 124 of the semiconductorsubstrate beginning at the corner 122 and extend over more than 100000μm² of the main surface of the semiconductor substrate. In other words,the at least one corner area 120 may extend over more than 100000 μm²(or more than 200000 μm², more than 0.5 mm² or more than 1 mm²).

The at least one corner area 120 is bordered at two sides by the edges124 of the semiconductor substrate. However, the at least one other sidemay comprise an arbitrary shape. Nevertheless, it may cover enough areato prevent the main electric circuit of being too close to the cornerarea 120 with enhanced crack risk. Therefore, optionally, the at leastone corner area 120 may extend at least over a triangle with a corner ofthe at least one corner area 120 being a corner of the triangle and theedges 124 of the semiconductor substrate comprised by the at least onecorner area 120 being edges of the triangle. The third edge of thetriangle may connect points at least 300 μm along the edges 124 awayfrom the corner 122, for example. In this way, also inside the mainsurface of the semiconductor substrate, the main electric circuit may besufficiently spaced away from the corner 122. However, the corner area120 may comprise also another geometric shape. For example, FIG. 5 showsa stepped shape side 510 of a corner area 120 connecting points of thecorner area 120 at least 300 μm along the edges 124 away from the corner122.

The semiconductor substrate can be of any thickness. However, theprobability of cracks occurring due to the described effect may increasewith decreasing thickness of the semiconductor substrate. Depending onthe kind of semiconductor device and its application, the semiconductorsubstrate may comprise a thickness of less than 120 μm (or less than 100μm or less than 80 μm or less than 50 μm).

The main electric circuit may be completely manufactured within the mainregion 110 or may be manufactured solely within the main region 110. Inother words, the main electrical circuit may comprise all elementsmanufactured on the semiconductor substrate necessary to provide thefull functionality of the semiconductor device in an operating state(e.g. power transistor together with logic circuits for a smart powersemiconductor device). However, as already mentioned, the main electriccircuit may use the semiconductor substrate as an electrode. In otherwords, the main electric circuit may be manufactured completely withinthe main region 110 on the semiconductor substrate and may be configuredto use the semiconductor substrate as an electrode. In this way, onlythis electrode may be affected by a crack in the corner area 120 so thatshorts to other elements of the main electric circuit can be avoided.

For example, the semiconductor substrate may represent a bulk electrodeof at least one element (e.g. a transistor) of the main electric circuitor more represent a drain electrode of at least one element (e.g. powertransistor) of the main electric circuit. In this way, for example powertransistors as well as logic transistors can be realized withsignificantly reduced risk of a malfunction or a breakdown due to cracksat the corner region.

Optionally, the electrode represented by the semiconductor substrate maybe realized at an opposite surface of the main surface of thesemiconductor substrate and may be configured to be used as a back sidecontact for at least one element of the main electric circuit.Alternatively, the electrode represented by the semiconductor substratemay be connectable from the main surface of the semiconductor substrate.In this way, a large variety of semiconductor devices can be realized.

The space of the corner area 120 may be left empty (without electricallyconductive structures) or may be filled with dummy structures or may beused for implementing electric test circuits, for example.

In one example, the semiconductor device 100 may further comprise anoptional electric test circuit manufactured within the at least onecorner area 120 on the semiconductor substrate. The electric testcircuit may be operable to enable an electric test function. Thiselectric test function may be executable independently from the electricmain function. In other words, the corner area 120 may be used toimplement test structures (e.g. for production tests or productionmonitoring). Optionally, the electric test circuit may (also) use thesemiconductor substrate as an electrode, for example.

Depending on the kind of semiconductor device and/or the applicationdifferent electric test circuits may be implemented. For example, theelectric test circuit may be operable to enable an ON-state resistancemeasurement of the semiconductor substrate or a gate oxide breakdownvoltage measurement.

Alternatively, the semiconductor device 100 may further compriseoptionally an electric dummy structure manufactured within the at leastone corner area 120 on the semiconductor substrate. In this connection,electrically conductive structures of the electric dummy structure maybe electrically connected to the semiconductor substrate or electricallyisolated so that in an operating state of the semiconductor device 100each of the electrically conductive structures of the electric dummystructure may either comprise basically the same electric potential asthe semiconductor substrate (e.g. with a tolerance of less than 30%,less than 20% or less than 10% of the electric potential of thesemiconductor substrate) or may be electrically floating (isolated fromother conductive structures). In other words, electrically conductivestructures implemented for increasing the structural homogeneity of thecorner area 120 compared to the main region 110 may be floating or atthe same electrical potential as the semiconductor substrate so thatshorts between electrically-conductive structures with differentelectrical potential due to cracks can be avoided.

For the same reason, for example, optionally all electrical conductivestructures manufactured within the corner area 120 on the semiconductorsubstrate may be electrically connected to the semiconductor substrateor electrically isolated so that in an operating state of thesemiconductor device each of the electrically conductive structureseither comprises basically the same electric potential as thesemiconductor substrate or may be electrically floating. In this way,the possibility of shorts due to cracks caused by the described effectcan be significantly reduced.

A semiconductor device 100 may comprise within the corner area 120 onlyelectric test structures or only electric dummy structures oralternatively at least one electric test circuit and electric dummystructures.

As mentioned, the corner area 120 can also be left empty. However, inorder to increase the structural homogeneity between the corner area 120and the main region 110 with the main electric circuit, similarstructures may be realized within the corner area 120 and the mainregion 110.

For example, the main region 110 and the at least one corner area 120may comprise structures fabricable or fabricated by using at least thesame trench etch process. A trench etch process may generate a largetopology or unevenness (e.g. surface with varying height) on the surfaceof the semiconductor substrate which may lead to stress. By increasingthe homogeneity of the distribution of the trenches, the stress may bereduced. An example for similar trench structures manufactured by thesame trench etch process is shown in FIG. 6. In the lower left corner,parallel trenches 610 within the main region 110 are neighboringparallel trenches 620 within the corner region 120 in the upper rightcorner.

Optionally, alternatively or additionally, the main region 110 and theat least one corner area 120 may comprise structures fabricable orfabricated by using at least a same trench oxidation process. In thisway, a homogenous oxidation layer may be manufactured within both areasso that the stress between the semiconductor substrate and the oxidationlayer might be reduced, for example.

Optionally, alternatively, or additionally, the main region 110 and theat least one corner area 120 may comprise structures fabricable orfabricated by using at least a same polysilicon fill process. Forexample, trenches may be filled by polysilicon. If trenches within bothregions may be filled by the same polysilicon fill process, thehomogeneity within the areas can be increased and stress may be reduced.

An example for similar structures within the main region 110 and thecorner area 120 is shown in FIG. 7. FIG. 7 shows a schematic crosssection of a trench 710 within the main region 110. The trench may befilled by a first polysilicon fill 720 separated by an oxide layer froma second polysilicon fill 730. Further, an oxide layer 740 is locatedbetween the semiconductor substrate 700 and the polysilicon fill 720,730. For example, the structure may realize a transistor for a powersemiconductor device. In this example, the first polysilicon fill 720may be a source electrode, the second polysilicon fill 730 may be a gateelectrode and the semiconductor substrate 700 may represent a drainelectrode of the transistor. The semiconductor device may comprise alarge number of such structures in parallel. Similar or equal structuresmay be comprised by the corner region 120 resulting in a highhomogeneity. The transistor structures contained by the corner area 120may comprise source electrodes connected to the semiconductor substrate(representing the drain electrode) to avoid different electricpotentials within the corner area 120.

For example, in connection with an electric test circuit, the mainelectric circuit may comprise at least onemetal-oxide-semiconductor-field-effect-transistor (MOSFET) structure andthe electric test circuit may comprise at least one MOSFET structure.The MOSFET structure of the main electric circuit and the MOSFETstructure of the electric test circuit may be fabricable or fabricatedsimultaneously by the same manufacturing processes. In this way, thehomogeneity within the main region 110 and a corner area 120 may beincreased.

Further optionally, also the topology or unevenness of the main surfacemay be more homogeneous, if the corner area 120 may also comprise asimilar metal occupancy density compared to the main region 110 withinthe upper layers. In other words, the main region 110 and the at leastone corner area 120 may comprise at least one metal layer comprising asame metal occupancy density with a tolerance of less than 20% (or lessthan 10% or less than 1%) of a metal occupancy. A metal layer comprisesareas filled with metal (e.g. copper or aluminum) and areas filled withinsulator (e.g. silicon dioxide). The metal occupancy density may be aratio between areas filled with metal and areas filled with insulatorwithin the metal layer.

Some examples relate to a semiconductor device comprising asemiconductor substrate and electrical conductive structures. Thesemiconductor substrate comprises a main surface with a polygonalgeometry. The main surface comprises corner areas at corners of thepolygonal area. Each corner area extends at least 300 μm along the edgesof the semiconductor substrate, beginning at the respective corners.Further, the electrical conductive structures are manufactured withinthe corner areas on the semiconductor substrate. All electricalconductive structures manufactured within the corner areas on thesemiconductor substrate are electrically connected to the semiconductorsubstrate or electrically isolated so that in an operating state of thesemiconductor device, each of the electrically conductive structureseither comprises basically the same electric potential as thesemiconductor substrate or is electrically floating.

Further, the semiconductor device may comprise one or more additional,optional features, realizing one or more aspects of the conceptsdescribed above.

In some embodiments, a semiconductor device comprises a semiconductorsubstrate comprising a main surface with a polygonal geometry. Further,means for performing a main electric function are manufactured within amain region on the semiconductor substrate. The main region extends overthe main surface of the semiconductor substrate leaving open at leastone corner area at a corner of the polygonal geometry of the mainsurface of the semiconductor substrate. The corner area extends at least300 μm along the edges of the semiconductor substrate beginning at thecorner.

Some embodiments relate to a power semiconductor device comprising asemiconductor device according to the concept described above or anembodiment described above. In this connection, at least one activeelement (e.g. a transistor) of the main electric circuit comprises abreakdown voltage higher than 10 V (or higher than 20 V, higher than 50V, higher than 200 V or higher than 1000 V).

Some embodiments relate to a chip comprising a semiconductor deviceaccording to the described concept or an embodiment described above withat least one input interface (e.g. pad for receiving an input signal)and at least one output interface (e.g. pad for outputting an outputsignal) for the main electric circuit.

FIG. 8 shows a flowchart of a method 800 for manufacturing asemiconductor substrate according to an embodiment. The method 800comprises providing a semiconductor substrate comprising a main surfacewith a polygonal geometry and manufacturing 820 a main electric circuitwithin a main region on the semiconductor substrate. The main electriccircuit is operable to perform an electric main function. Further, themain region extends over the main surface of the semiconductor substrateleaving open at least one corner area at the corner of the polygonalgeometry of the main surface of the semiconductor substrate. The cornerarea extends at least 300 μm along the edges of the semiconductorsubstrate beginning at the corner.

The method 800 may comprise one or more additional, optional steps,realizing in one or more aspects of the concept described above.

Some embodiments relate to chamfered chip corners for MOSFET structuresfor an immunization against cracks. In this connection, all (or some)possibly affected chip regions (e.g. the corners) may be designedelectrically immune against entering cracks, in a way that these regionsare set to the corresponding potential as the crack region. For example,all regions are set to the drain potential.

There may be the risk that a plurality of chips is affected by cracks inthe corner area. A crack may be initially a lateral crack at thebackside of the semiconductor substrate. A secondary crack may start atthat initial point. The secondary crack may further propagate to thechip front side.

For example, it is suggested to chamfer the chip corners in an area ofapproximately 500 μm and leave this area open from electric structures(e.g. shown in FIG. 4).

However, leaving open these areas may disturb the homogeneity of theneighboring electrically active cell field areas (main region of thesemiconductor substrate) during the different manufacturing processes(e.g. etching of trenches, polysilicon recess process), since the area(corner areas) may be relatively large, for example. Therefore, theareas left open (corner areas) may be realized as (almost) exact copiesof a small cell field and/or small MOSFET areas, but short circuitingall potentials of this small MOSFET area with the drain contact (e.g.FIG. 5).

The active main MOSFET (or the main region of the semiconductorsubstrate) may be surrounded by a normal edge closing-off and a closeddrain ring, for example. However, also the main MOSFET (as well as thecorner area) may comprise a chamfered shape. The small MOSFET (withinthe corner area) may be completely short circuited in metal (within themetal layers) with a drain contact in the chip corner (corner area).Apart from that, it may be built up equal to the main MOSFET andprovides a good homogeneity during the manufacturing processes mentionedabove. Further, also the front end on-state resistance measurement(Ron*A) may be improved, since the corners implemented according to thedescribed concept can be used for a sense measurement of the drainpotential during the Ron measurement. This may provide significantlymore accurate Ron measurement data, since without chamfer corners, thedrain potential is tapped at a chuck. This method has an undefinedadditional contact resistance due to the pressing of the wafer to thechuck by a vacuum and falsifies the Ron measurement data in this way.

According to an aspect, the corner areas left open may be at least 300μm to 500 μm large or extend over an area larger than 100000 μm²(or >750 μm left open or an area larger than 0.5 μm² per corner).

Cut out areas or areas left open (areas contained by the main region ofthe semiconductor surface) may also be possible at other positions of achip (e.g. pad area or gate finger area). Also generally, areas in therange of 0.1 μm² to 0.5 μm² or even larger may be left open at stresscritical areas.

Further, cut out areas or areas left open in chip (corner) areas may berealized with cell field similar drain contact structures electricallyimmunizing them against cracks. Cell field similar may also mean onlyone or few photo layers (e.g. photo technique trench). The drain contactstructure may be generally also a contact structure to an arbitraryelectric potential which may not disturb the MOSFET functionality undercrack conditions, for example.

The corners left open may be used for large area MOSFETs (e.g. >25mm², >20 mm² or >12 mm².

Embodiments may further provide a computer program having a program codefor performing one of the above methods, when the computer program isexecuted on a computer or processor. A person of skill in the art wouldreadily recognize that steps of various above-described methods may beperformed by programmed computers. Herein, some embodiments are alsointended to cover program storage devices, e.g., digital data storagemedia, which are machine or computer readable and encodemachine-executable or computer-executable programs of instructions,wherein said instructions perform some or all of the steps of saidabove-described methods. The program storage devices may be, e.g.,digital memories, magnetic storage media such as magnetic disks andmagnetic tapes, hard drives, or optically readable digital data storagemedia. The embodiments are also intended to cover computers programmedto perform said steps of the above-described methods or (field)programmable logic arrays ((F)PLAs) or (field) programmable gate arrays((F)PGAs), programmed to perform said steps of the above-describedmethods.

The description and drawings merely illustrate the principles of theinvention. It will thus be appreciated that those skilled in the artwill be able to devise various arrangements that, although notexplicitly described or shown herein, embody the principles of theinvention and are included within its spirit and scope. Furthermore, allexamples recited herein are principally intended expressly to be onlyfor pedagogical purposes to aid the reader in understanding theprinciples of the invention and the concepts contributed by theinventor(s) to furthering the art, and are to be construed as beingwithout limitation to such specifically recited examples and conditions.Moreover, all statements herein reciting principles, aspects, andembodiments of the invention, as well as specific examples thereof, areintended to encompass equivalents thereof.

Functional blocks denoted as “means for . . . ” (performing a certainfunction) shall be understood as functional blocks comprising circuitrythat is adapted for performing a certain function, respectively. Hence,a “means for s.th.” may as well be understood as a “means being adaptedor suited for s.th.”. A means being adapted for performing a certainfunction does, hence, not imply that such means necessarily isperforming said function (at a given time instant).

Functions of various elements shown in the figures, including anyfunctional blocks labeled as “means”, “means for performing an electricmain function”, etc., may be provided through the use of dedicatedhardware, such as “a signal provider”, “a signal processing unit”, “aprocessor”, “a controller”, etc. as well as hardware capable ofexecuting software in association with appropriate software. Moreover,any entity described herein as “means”, may correspond to or beimplemented as “one or more modules”, “one or more devices”, “one ormore units”, etc. When provided by a processor, the functions may beprovided by a single dedicated processor, by a single shared processor,or by a plurality of individual processors, some of which may be shared.Moreover, explicit use of the term “processor” or “controller” shouldnot be construed to refer exclusively to hardware capable of executingsoftware, and may implicitly include, without limitation, digital signalprocessor (DSP) hardware, network processor, application specificintegrated circuit (ASIC), field programmable gate array (FPGA), readonly memory (ROM) for storing software, random access memory (RAM), andnon-volatile storage. Other hardware, conventional and/or custom, mayalso be included.

It should be appreciated by those skilled in the art that any blockdiagrams herein represent conceptual views of illustrative circuitryembodying the principles of the invention. Similarly, it will beappreciated that any flow charts, flow diagrams, state transitiondiagrams, pseudo code, and the like represent various processes whichmay be substantially represented in computer readable medium and soexecuted by a computer or processor, whether or not such computer orprocessor is explicitly shown.

Furthermore, the following claims are hereby incorporated into theDetailed Description, where each claim may stand on its own as aseparate embodiment. While each claim may stand on its own as a separateembodiment, it is to be noted that—although a dependent claim may referin the claims to a specific combination with one or more otherclaims—other embodiments may also include a combination of the dependentclaim with the subject matter of each other dependent claim. Suchcombinations are proposed herein unless it is stated that a specificcombination is not intended. Furthermore, it is intended to include alsofeatures of a claim to any other independent claim even if this claim isnot directly made dependent to the independent claim.

It is further to be noted that methods disclosed in the specification orin the claims may be implemented by a device having means for performingeach of the respective steps of these methods.

Further, it is to be understood that the disclosure of multiple steps orfunctions disclosed in the specification or claims may not be construedas to be within the specific order. Therefore, the disclosure ofmultiple steps or functions will not limit these to a particular orderunless such steps or functions are not interchangeable for technicalreasons. Furthermore, in some embodiments a single step may include ormay be broken into multiple sub steps. Such sub steps may be includedand part of the disclosure of this single step unless explicitlyexcluded.

1. A semiconductor device comprising: a semiconductor substratecomprising a main surface with a polygonal geometry; and a main electriccircuit manufactured within a main region on the semiconductorsubstrate, wherein the main electric circuit is operable to perform anelectric main function, wherein the main region extends over the mainsurface of the semiconductor substrate leaving open at least one cornerarea at a corner of the polygonal geometry of the main surface of thesemiconductor substrate, wherein the corner area extends at least 300 μmalong the edges of the semiconductor substrate beginning at the corner,further comprising an electric test circuit manufactured within the atleast one corner area on the main surface of the semiconductorsubstrate, wherein the electric test circuit is operable to enable anelectrical test function, wherein the main electric circuit comprises atleast one MOSFET structure and the electric test circuit comprises atleast one MOSFET structure, wherein the MOSFET structure of the mainelectric circuit and the MOSFET structure of the electric test circuitare manufacturable simultaneously by the same manufacturing processes.2. The semiconductor device according to claim 1, wherein the mainregion extends over the main surface of the semiconductor substrateleaving open a corner area at every corner of the polygonal geometry ofthe main surface of the semiconductor substrate, wherein each cornerarea extends at least 300 μm along the edges of the semiconductorsubstrate beginning at the respective corners.
 3. The semiconductordevice according to claim 1, wherein the at least one corner areaextends at least over a triangle area, wherein the corner of the atleast one corner area is a corner of the triangle and the edges ofsemiconductor substrate comprised by the at least one corner area areedges of the triangle.
 4. (canceled)
 5. (canceled)
 6. The semiconductordevice according to claim 1, wherein the electric test circuit isoperable to enable an on-state resistance measurement of a device of themain electric circuit on the semiconductor substrate.
 7. Thesemiconductor device according to claim 1, further comprising anelectric dummy structure manufactured within the at least one cornerarea on the main surface of the semiconductor substrate, whereinelectrically conductive structures of the electric dummy structure areelectrically connected to the semiconductor substrate or electricallyisolated so that in an operating state of the semiconductor device eachof the electrically conductive structures of the electric dummystructure either comprise basically the same electric potential as thesemiconductor substrate or is electrically floating, respectively. 8.The semiconductor device according to claim 1, wherein all electricallyconductive structures manufactured within the corner area on thesemiconductor substrate are electrically connected to the semiconductorsubstrate or electrically isolated so that in an operating state of thesemiconductor device each of the electrically conductive structureseither comprises basically the same electric potential as thesemiconductor substrate or is electrically floating, respectively. 9.The semiconductor device according to claim 1, wherein the main regionand the at least one corner area comprise structures manufacturable byusing at least a same trench etch process.
 10. The semiconductor deviceaccording to claim 1, wherein the main region and the at least onecorner area comprise structures manufacturable by using at least a sametrench oxidation process.
 11. The semiconductor device according toclaim 1, wherein the main region and the at least one corner areacomprise structures manufacturable by using at least a same polysiliconfill process.
 12. The semiconductor device according to claim 1, whereinthe main region and the at least one corner area comprise at least onemetal layer comprising a same metal occupancy density with a toleranceof less than 20% of a metal occupancy density of the main region. 13.The semiconductor device according to claim 1, wherein the semiconductorsubstrate comprises a thickness of less than 120 μm.
 14. Thesemiconductor device according to claim 1, wherein the at least onecorner area extends over more than 100000 μm².
 15. The semiconductordevice according to claim 1, wherein the at least one corner areaextends at least 500 μm along the edges of the semiconductor substratebeginning at the corner.
 16. The semiconductor device according to claim1, wherein the main electric circuit is manufactured completely withinthe main region on the semiconductor substrate and is configured to usethe semiconductor substrate as an electrode.
 17. The semiconductordevice according to claim 16, wherein the semiconductor substraterepresents a bulk electrode of at least one element of the main electriccircuit or represents a drain electrode of at least one element of themain electric circuit.
 18. The semiconductor device according to claim16, wherein an opposite surface of the main surface of the semiconductorsubstrate is configured to be used as a backside contact for at leastone element of the main electric circuit.
 19. The semiconductor deviceaccording to claim 1, wherein the main electrical circuit comprises allelements manufactured on the semiconductor substrate necessary toprovide the full functionality of the semiconductor device in anoperating state.
 20. (canceled)
 21. (canceled)
 22. A power semiconductordevice comprising a semiconductor device, the semiconductor devicecomprising: a semiconductor substrate comprising a main surface with apolygonal geometry, wherein the semiconductor substrate comprises athickness of less than 120 μm; a main electric circuit manufacturedwithin a main region on the semiconductor substrate, wherein the mainelectric circuit is operable to perform an electric main function,wherein the main region extends over the main surface of thesemiconductor substrate leaving open a corner area at every corner ofthe polygonal geometry of the main surface of the semiconductorsubstrate, wherein each corner area extends at least 500 μm along theedges of the semiconductor substrate beginning at the corners; and anelectric test circuit manufactured within at least one corner area onthe semiconductor substrate, wherein the electric test circuit isoperable to enable an electrical test function, wherein at least oneactive element of the main electric circuit comprises a breakdownvoltage higher than 10V.
 23. A method for manufacturing a semiconductordevice, the method comprising: providing a semiconductor substratecomprising a main surface with a polygonal geometry; and manufacturing amain electric circuit within a main region on the semiconductorsubstrate, wherein the main electric circuit is operable to perform anelectric main function, wherein the main region extends over the mainsurface of the semiconductor substrate leaving open at least one cornerarea at a corner of the polygonal geometry of the main surface of thesemiconductor substrate, wherein the corner area extends at least 300 μmalong the edges of the semiconductor substrate beginning at the corner,further comprising an electric test circuit manufactured within the atleast one corner area on the main surface of the semiconductorsubstrate, wherein the electric test circuit is operable to enable anelectrical test function, wherein the main electric circuit comprises atleast one MOSFET structure and the electric test circuit comprises atleast one MOSFET structure, wherein the MOSFET structure of the mainelectric circuit and the MOSFET structure of the electric test circuitare manufacturable simultaneously by the same manufacturing processes.